In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...
While a microphone is useful for many things, you probably wouldn't guess that it could help make movies of molecules or measure physical and chemical properties of a material at the nanoscale with ...
A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...
insights from industryDr. Thomas MuellerDirector of Product ManagementBruker Nano Surfaces An interview with Dr. Thomas Mueller, Director of Product Management at Bruker Nano Surfaces conducted by ...
A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...
Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...
insights from industryDr. André KörnigApplication ScientistBruker BioAFM In this interview, Dr. André Körnig, Application Scientist at Bruker BioAFM discusses the applications of BioAFM in the life ...
Georgia Tech has developed a new probe for AFM (the primary tool for nano-scale imaging) capable of high-speed imaging 100 times faster than current AFM. This technology could prove invaluable for ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today that its next-generation Atomic Force Microscope (AFM), Vero, has received three prestigious awards. Vero AFM ...
WOODBURY, N.Y.--(BUSINESS WIRE)--July 9, 2004--Veeco Instruments Inc. (Nasdaq:VECO) announced today that it received several multiple unit orders for its next-generation atomic force microscopes (AFMs ...
Bruker’s PeakForce Tapping is an exclusive operating mode in atomic force microscope (AFM) technology following the launch of TappingMode. This mode provides high resolution imaging, measuring samples ...
A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...
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