Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

•Average fault coverage for randomly generated test vectors was 60% or better depending on the type of circuit and the number of vectors applied (Max 98% or better). •Fault coverage for test vectors ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

This is where ATPG comes in once again, as ATPG tools evolve to provide coverage metrics for at-speed tests. One of the most common at-speed vectors used with ATPG is the transition vector, which is ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.