Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...

As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Today's leading-edge system-on-chip (SoC) designs typically have multiple clock domains and, in many cases, multiple internally generated clocks. In test mode, those clocks may be combined into one, ...

Watch the video below, where Lee Harrison – Director of Automotive IC Solutions at Siemens EDA – explains the technology behind full In-System ATPG testing for advanced semiconductors Continuous ...

The very process of testing digital circuits routinely increases their dynamic power consumption to levels far exceeding their power specification. If the power consumption is great enough, it can ...

Chip Design Engineers are on a binge today, drawing up design plans for unprecedented, ever-increasing functionality on a single chip. Many times this surge encounters a brick wall in the form of ...