The complexity of electronic-device testing varies widely, ranging from the simplest type—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual ...
An 8 Gbps high-speed relay MMIC for an Automated Test Equipment (ATE) using a gallium nitride is developed and evaluated. Metal-Insulator-Semiconductor structure with a tantalum oxynitride is employed ...
For more than six decades, artisans at Tobyhanna Army Depot (TYAD) have been at the forefront of repairing and employing automatic test equipment (ATE)to diagnose and test military equipment. That ...
In 2019, automated test and airborne data loading technology is being disrupted by the introduction of never seen before technological concepts, including the world’s first cockpit control panel robot ...
Device power supply (DPS) ICs have flexible force voltage and force current capacities to provide dynamic test capabilities to automated test equipment (ATE). The DPS IC is a voltage source when the ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
Innovations in semiconductor technology—such as advancements in AI high-performance computing (HPC), Angstrom-scale silicon process nodes, silicon photonics, and automotive xEV wideband gap power ...
The types of devices being deployed in cars and how they differ in functionality. Why each device type requires a different test technique. Determining the best approach for the specific application.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback