As semiconductor chip technology advances towards nanometre and sub-nanometre scales, the demands becomes exponentially more ...

Lattice Semiconductor announced the latest release of the Lattice sensAI solution stack, delivering expanded model support, ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Scientists from China have developed a new deep-learning method for detecting defects in PV cells. Analyzing electroluminescence (EL) images, the novel system utilizes the YOLOv8 convolutional neural ...