Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
SIAM Journal on Applied Mathematics, Vol. 60, No. 2 (Dec., 1999 - Feb., 2000), pp. 664-678 (15 pages) In this paper we analyze hypersingular integral equations of the Peierls type specified on the ...
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