Figure 1: Model of rotational defect in graphene and TMDs. In the following, we present observations of such rotational defects. By combing scanning TEM (STEM) experiments with first-principles ...
Failure analysis typically begins with identifying a region of interest (ROI) on a sample for detailed examination using tools such as a Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), or ...
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