EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Digital Journal

Driving semiconductor chips testing success through innovation and leadership

Opinions expressed by Digital Journal contributors are their own. The semiconductor industry is experiencing rapid growth, driven by increasing demand for computers, automobiles, mobile phones, ...
Semiconductor Engineering

High-Speed Manufacturing And In-Field Scan Test Access Via PCI Express For GPIO Limited SoCs

This post addresses the specific hurdle of effective and efficient manufacturing tests for these complex devices. It outlines ...
Morningstar

yieldWerx and WATS Partner to Bridge PCB Test with Chip-Level Manufacturing Data

DRAMMEN, Norway, May 8, 2026 /PRNewswire/ -- Board-level and semiconductor test data are often analyzed separately, limiting correlation across the product lifecycle. Linking PCB assembly (PCBA) test ...