Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

SK Hynix has reportedly reached a significant milestone in its pre-production trials by raising the yield rate of its sixth-generation high-bandwidth memory (HBM4) to 70%. This achievement strengthens ...

Learning how to improve IC-fabrication yields through analysis of production test can be extremely valuable. The combination of Synopsys’ Odyssey design-for-test (DFT) module and its TetraMAX ...

FARGO - Don't confuse grain yield with test weight, cautions North Dakota State University Extension Service agricultural engineer Ken Hellevang. Grain yield is expressed as bushels per acre, and the ...

A study in Kagoshima, Japan has shown that the latest generation of TOPCon modules has surpassed p-type BC modules on energy yield during the initial month of a 1-year testing period, with an average ...