Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: This is an iterative process and can take months, so every step should be ...

Take advantage of the specification design pattern in C# to improve the modularity, maintainability, and reusability of your source code. Whеn wе work in business applications, our job is to writе ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...