Although the term DigRF may lead to initial impressions of a digital signal somehow integrated into an RF signal path, this is not the case. DigRF is a published standard that describes a digital ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
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